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Zeiss Crossbeam 540 FIB-SEM

Bioimaging Core - Gent
Offline
Electron Microscope
Ghent > FSVM-I - UGent - VIB Research Building - Technologiepark-Zwijnaarde 71 > W276
Note

The Cross-beam system makes use of a SEM for imaging and Focussed Ion Beam (FIB) for milling or as a cutting tool. Consecutive face-block imaging and milling results in 3D image data sets. Because the milling with the FIB can be tuned very precisely, both XY- and Z-resolution are in the nanometer range. This allows very detailed 3D segmentation and volume rendering of imaged objects within a sample.

For any FIB-SEM related questions, please contact Anneke.Kremer@ugent.vib.be.